Chinese Journal of Applied Chemistry ›› 1996, Vol. 0 ›› Issue (5): 61-63.

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Preparation and Properties of TiO2 Semiconductor Film

Xu Mingxia, Xu Tingxian, Liu Ning   

  1. Department of Materials Science and Engineering, Tianjin University, Tianjin 300072
  • Received:1995-12-25 Revised:1996-04-24 Published:1996-10-10 Online:1996-10-10

Abstract: The TiO2 semiconductor film on Al2O3 and glass substrates was prepared by homogeneous precipitation with titanyl sulfate and urea as raw materials. Under low concentration of TiOSO4 the increase of urea concentration could accelerate the formation of the film.The thickness of the film prepared at 70~80℃ for 1 h and calcined at 600℃ for 0.5 h (1 cycle) was over 0.2 μm while the thickness obtained by 4 cycles was over 0.8μm. The adhesion of the film was good. After calcining at 1000℃ for 0.5 h in H2 the film was crystallized into rutile phase having a square resistance of 1.3 × 104 Ω/□.

Key words: TiO2, semiconductor film, preparation