Chinese Journal of Applied Chemistry ›› 1990, Vol. 0 ›› Issue (6): 9-13.

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XPS AND AES STUDIES OF ANTITARNISH FILM ON TIN SURFACE

Fang Jingli1, Wu Naijun2, Wang Zhanwen2   

  1. 1. Applied Chemistry Institute, Nanjing University, Nanjing 210008;
    2. Department of Applied Chemistry, Nanjing Institute of Chemical Technology, Nanjing
  • Received:1989-11-16 Revised:1990-04-07 Published:1990-12-10 Online:1990-12-10

Abstract: It is found by accelerating tarnish test of cysteine solution that ethylenediamine tetra-methylene phosphoric acid(EDTMP)was an excellent antitarnishing agent for tinplate. The antitarnish mechanism of EDTMP for tinplate has been studied by XPS, AES and laser Raman spectromety. A complicated anticorrosion film was formed on tin surface. The relative atomic percent contents(A. C. %)or the film obtained from the constant element comosition region of the profile curves were O 48.0%,Sn 10.7%, N 7.7%,C 23.1% and P 10.5.

Key words: XPS, AES, antitarnish film, tin