In-situ Atomic Force Microscopy Study on Phase Diagram of Poly(methyl methacrylate)/Poly(styrene-co-acrylonitrile) Blend Films Surface

doi:10.3724/SP.J.1095.2014.30122

Chinese Journal of Applied Chemistry

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In-situ Atomic Force Microscopy Study on Phase Diagram of Poly(methyl methacrylate)/Poly(styrene-co-acrylonitrile) Blend Films Surface

TAO Huichun^1*, ZHANG Shuangshuang², ZHANG Jingying¹, AI Shuping¹, YOU Jichun²

(1.Department of Basic Science,Jilin Jianzhu University,Changchun 130118,China;
2.College of Material,Chemistry and Chemical Engineering,Hangzhou Normal University,Hangzhou 310036,China)

Received:2013-03-12 Revised:2013-05-27 Published:2014-01-10 Online:2014-01-10

Abstract

Abstract: The phase diagram of surface phase separation in poly(methyl methacrylate)/poly(styrene-co-acrylonitrile)(PMMA/SAN) blend film with thickness of 130 nm was obtained by in-situ atomic force microscopy(AFM). The results show that the blend film has a lower critical system temperature(LCST) compared with the reported ex-situ phase diagram. The critical phase separation temperature was found to increase and the observed composition symmetry in ex-situ phase diagram was no longer existed. The difference between in-situ and ex-situ results can be ascribed to the thinner thickness of the film, different heat history and stronger substrate effect.

Key words: polymer blend, phase separation, in-situ, atomic force microscopy

CLC Number:

O631

TAO Huichun1*, ZHANG Shuangshuang2, ZHANG Jingying1, AI Shuping1, YOU Jichun2. In-situ Atomic Force Microscopy Study on Phase Diagram of Poly(methyl methacrylate)/Poly(styrene-co-acrylonitrile) Blend Films Surface[J]. Chinese Journal of Applied Chemistry, DOI: 10.3724/SP.J.1095.2014.30122.

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In-situ Atomic Force Microscopy Study on Phase Diagram of Poly(methyl methacrylate)/Poly(styrene-co-acrylonitrile) Blend Films Surface

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