应用化学 ›› 1996, Vol. 0 ›› Issue (5): 61-63.

• 研究简报 • 上一篇    下一篇

TiO2半导体薄膜的制备与特性

徐明霞, 徐廷献, 刘宁   

  1. 天津大学材料系 天津 300072
  • 收稿日期:1995-12-25 修回日期:1996-04-24 出版日期:1996-10-10 发布日期:1996-10-10
  • 基金资助:
    福特-中国研究与发展基金;天津市自然科学基金

Preparation and Properties of TiO2 Semiconductor Film

Xu Mingxia, Xu Tingxian, Liu Ning   

  1. Department of Materials Science and Engineering, Tianjin University, Tianjin 300072
  • Received:1995-12-25 Revised:1996-04-24 Published:1996-10-10 Online:1996-10-10

摘要: TiO2薄膜或涂层,作为优良的色材、氧敏传感器材料和湿式太阳电池的光电阳极材料具有广阔的应用前景.传统制膜技术主要采用物理气相法((PVD)和化学气相法(CVD),其设备投资大.液相法以溶胶-凝胶法居多,其原料一般采用价格昂贵的钦醇盐.

关键词: TiO2, 半导体薄膜, 制备

Abstract: The TiO2 semiconductor film on Al2O3 and glass substrates was prepared by homogeneous precipitation with titanyl sulfate and urea as raw materials. Under low concentration of TiOSO4 the increase of urea concentration could accelerate the formation of the film.The thickness of the film prepared at 70~80℃ for 1 h and calcined at 600℃ for 0.5 h (1 cycle) was over 0.2 μm while the thickness obtained by 4 cycles was over 0.8μm. The adhesion of the film was good. After calcining at 1000℃ for 0.5 h in H2 the film was crystallized into rutile phase having a square resistance of 1.3 × 104 Ω/□.

Key words: TiO2, semiconductor film, preparation