应用化学 ›› 1990, Vol. 0 ›› Issue (1): 28-32.

• 研究论文 • 上一篇    下一篇

某些硫代磷酸酯化合物的负离子电子轰击质谱(NIEI-MS)

朱育芬, 唐大志, 詹东亮, 金京秀   

  1. 中国科学院广州化学研究所 广州 510650
  • 收稿日期:1989-03-16 修回日期:1989-08-17 出版日期:1990-02-10 发布日期:1990-02-10

THE NEGATIVE ION ELECTRON IMPACT MASS SPECTRA OF SOME PHOSPHONQTHIONATES

Zhu Yufen, Tang Dazhi, Zhan Dongling, Jin Jingxiu   

  1. Guangzhou Institute of Chemistry, Academia Sinica, Guangzhou 510650
  • Received:1989-03-16 Revised:1989-08-17 Published:1990-02-10 Online:1990-02-10

摘要: 本文应用低分辨负离子电子轰击质谱及亚稳分析数据,研究了10种硫代磷酯酸化合物的负离子质谱特征,探讨了其碎裂规律。指出取代基的性质及其位置对分子异构化重排有明显影响。

关键词: 硫代磷酸酯, 负离子电子轰击质谱, 分子异构化重排

Abstract: The negative ion electron impact mass spectra(NIEJ-MS)and their cleavage in somephosphonothionates were discussed on the basis of low resolution mass spctral and meta-stable ion analysis. It is found that the property and the position of the substituentshave a marked influence on the isomeric rearrangement of the phosphonothionate.

Key words: phosphonothionate, negative ion electron impact mass spectra, isomeric rearangement