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Wide-Angle X-ray Diffraction Characterization of Microstructural Evolution of Metallocene Polyethylene Film During Stress Relaxation and Fatigue Process
Yi-Huai ZHANG, Tao LIAO, Yong-Feng MEN
Chinese Journal of Applied Chemistry . 2025, (
12
): 1661 -1670 . DOI: 10.19894/j.issn.1000-0518.250198
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