In- situ Wide-Angle X-ray Diffraction Characterization of Microstructural Evolution of Metallocene Polyethylene Film During Stress Relaxation and Fatigue Process
Yi-Huai ZHANG, Tao LIAO, Yong-Feng MEN
Chinese Journal of Applied Chemistry . 2025, (12): 1661 -1670 .  DOI: 10.19894/j.issn.1000-0518.250198