小角X射线散射技术的绝对散射强度校正

doi:10.11944/j.issn.1000-0518.2016.07.150462

摘要/Abstract

摘要：

小角X射线散射绝对强度的校正对获得样品微观结构定量参数非常重要。本文描述了一种通过对探测器直接测量入射光束的强度进行校正的方法。其适用性利用标准样品(水)的绝对散射强度标定进行了证实。将此方法应用到聚甲基丙烯酸甲酯乳液和高密度聚乙烯上,得到了相应散射体的体积分数和比表面积。 PMMA的体积分数与通过密度算得的结果很接近。淬火的高密度聚乙烯的比表面积比缓慢降温的大。

关键词: 校正, 绝对强度, 小角X射线散射

Abstract:

Absolute calibration of small-angle X-ray scattering data is necessary for determining quantitative parameters of microstructure of the samples. This work details the absolute calibration method by the measurement of incident beam directly with Pilatus detector. Absolute calibration of standard sample(water) was carried out to verify this method. Application of this method to a poly(methyl methacrylate) colloidal dispersion and a high density polyethylene were performed to obtain the volume fraction and specific surface of scatters. The volume fraction of polymethylmethacrylate(PMMA) is close to the result calculated by density. The specific surface of quenched high density polyethylene is larger than slow cooled sample.

Key words: calibration, absolute intensity, small-angle X-ray scattering

陈冉, 门永锋. 小角X射线散射技术的绝对散射强度校正[J]. 应用化学, 2016, 33(7): 774-779.

CHEN Ran, MEN Yongfeng. Calibration of Absolute Scattering Intensity in Small-angle X-Ray Scattering[J]. Chinese Journal of Applied Chemistry, 2016, 33(7): 774-779.

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