中华医学超声杂志

应用化学 ›› 1987, Vol. 0 ›› Issue (4): 31-34.

• 研究论文 • 上一篇    下一篇

SIS的正电子湮没寿命谱的研究

秦安慰1, 陈晓禾1, 潘玉莲2, 邱励欧2   

  1. 1. 复旦大学材料科学系;
    2. 复旦大学物理系
  • 收稿日期:1986-04-12 修回日期:1986-10-17 出版日期:1987-08-10 发布日期:1987-08-10

POSITRON ANNIHILATION IN SIS

Qin Anwei1, Chen Xiaohe1, Pan Yulian2, Qiu Ll'ou2   

  1. Fudan University, Shanghai
  • Received:1986-04-12 Revised:1986-10-17 Published:1987-08-10 Online:1987-08-10

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摘要： 用正电子湮没技术,在-80°～100℃温度范围内,测量了苯乙烯-异戊二烯-苯乙烯三嵌段聚合物(SIS)的正电子寿命谱。在长寿命成分的温度谱中,实验发现除了有和聚异戊二乙烯及聚苯乙烯的玻璃化温度相对应的温度转变区外,在37℃还存在一个温度转变区。这个中间转变温度可以解释为SIS嵌段共聚物的中间相的玻璃化转变温度。

Abstract: The positron annihilation technique was used to study the properties of styrene-isoprene-styrene block copolymer in the temperature of - 80 to 100℃. In the temperature spectrum of the longest lifetime τ3, in addition to two transition temperatures which correspond to the glass transition temperatures of polyisoprene and polystyrene, an irregularity was observed.This transition temperature is interpreted as the glass transtion temperature of the interphase in block copolymers.

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